Method and/or apparatus for performing static timing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S731000

Reexamination Certificate

active

10789883

ABSTRACT:
An apparatus comprising a circuit configured to be tested and a plurality of test blocks within the circuit. Each of the test blocks generally comprises (i) a plurality of sequential elements and (ii) a plurality of logic elements. Each of the test blocks are configured to operate (a) in a first mode comprising a shift mode and (b) a second mode comprising a capture mode. The shift mode generally operates with multiple scan clocks that are clocked simultaneously. The capture mode generally operates with multiple scan clocks, but only one of which is toggled at a time.

REFERENCES:
patent: 5459736 (1995-10-01), Nakamura
patent: 5471481 (1995-11-01), Okumoto et al.
patent: 5487074 (1996-01-01), Sullivan
patent: 5878055 (1999-03-01), Allen

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