Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-06-12
2007-06-12
Tu, Christine T. (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S731000
Reexamination Certificate
active
10789883
ABSTRACT:
An apparatus comprising a circuit configured to be tested and a plurality of test blocks within the circuit. Each of the test blocks generally comprises (i) a plurality of sequential elements and (ii) a plurality of logic elements. Each of the test blocks are configured to operate (a) in a first mode comprising a shift mode and (b) a second mode comprising a capture mode. The shift mode generally operates with multiple scan clocks that are clocked simultaneously. The capture mode generally operates with multiple scan clocks, but only one of which is toggled at a time.
REFERENCES:
patent: 5459736 (1995-10-01), Nakamura
patent: 5471481 (1995-11-01), Okumoto et al.
patent: 5487074 (1996-01-01), Sullivan
patent: 5878055 (1999-03-01), Allen
Saado Alon
Young Linley
Maiorana PC Christopher P.
Tu Christine T.
Via Telecom Co., Ltd.
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