Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-09-05
2006-09-05
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07103857
ABSTRACT:
A method and latch circuit for implementing enhanced performance includes critical data and clock paths and non-critical sections. A low voltage threshold (LVT) transistor is used only in the critical data and clock paths. The non-critical sections are implemented with regular VT, (RVT), or low leakage (LLD) transistors. The latch circuit advantageously is implemented using LVT devices in the internal critical paths of the latch and RVT output buffer transistors.
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patent: 6090153 (2000-07-01), Chen et al.
patent: 6794914 (2004-09-01), Sani et al.
Dinh Paul
International Business Machines - Corporation
Pennington Joan
To Tuyen
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