Static information storage and retrieval – Read/write circuit – Testing
Patent
1999-02-18
2000-07-11
Nelms, David
Static information storage and retrieval
Read/write circuit
Testing
365200, G11C 700
Patent
active
060882743
ABSTRACT:
A method and apparatus for testing a semiconductor serial access memory (30) device through a main memory (20) includes a semiconductor memory comprising a main memory (20) and a serial access memory (30). A test data (48) is generated and an expected test data (50) that is equivalent to the test data (48) is also generated. The test data (48) is stored in the main memory and sent to the serial access memory (30). The test data (48) in the serial access memory is then sent back to the main memory (20) and stored in the main memory (20). The test data (48) is then read from the main memory (20). Then, the test data (48) read from the main memory is compared with the expected test data (50), producing an output having a first state if the test data (48) read from the main memory (20) is similar to the expected test data (50) or a second state if the test data (48) read from the main memory (20) is different than the expected test data (50).
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Dorney Timothy D.
Eplett Steven C.
Omer Rishad S.
Riley John E.
Hoel Carlton H.
Holland Robby T.
Nelms David
Telecky Jr. Frederick J.
Texas Instruments Incorporated
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