Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-07-25
2006-07-25
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07082586
ABSTRACT:
The invention permits a comparison of two technical systems, which according to conventional opinion is not possible to carry out, based on a substantially simpler, technically achievable comparison, in which part systems of one or both systems are specifically replaced. The replacements are performed in a controlled manner by monitoring a replacement condition with constraints. The monitoring of the replacement condition and the generation and monitoring of the necessary constraints occur automatically. A comparison of both systems can thus be carried out based on the replacement of the part systems without introducing a loss of precision in the comparison.
REFERENCES:
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International Preliminary Examination Report dated Feb. 27, 2003 ( 8 pp) for International Application No. PCT/DE01/03219 (English Translation).
Horeth Stefan
Warkentin Peter
24IP Law Group USA, PLLC
DeWitt Timothy R.
OneSpin Solutions GmbH
Siek Vuthe
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