4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Peter Warkentin

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Method and arrangement for the comparison of technical...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and configuration for comparing a first...

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate

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Method for the comparison of electrical circuits

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2589921

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