Electrical computers and digital processing systems: memory – Storage accessing and control – Hierarchical memories
Reexamination Certificate
2011-08-02
2011-08-02
Farrokh, Hashem (Department: 2187)
Electrical computers and digital processing systems: memory
Storage accessing and control
Hierarchical memories
C365S201000, C714S718000
Reexamination Certificate
active
07991955
ABSTRACT:
Achieving better uniformity of temperature on an integrated circuit while performing burn-in can result in reduced burn-in time and more uniform acceleration. One way to achieve better temperature uniformity is to control dynamic power in the core and cache by operating at different frequencies and increasing switching activity in the cache(s) during burn-in by changing operation of the cache so that during burn-in a plurality of memory locations in the cache(s) are accessed simultaneously, thereby increasing activity in the cache to achieve higher power utilization in the cache during burn-in.
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Andrade Victor F.
Bienek Michael D.
Braganza Michael C.
Posey Randal L.
Advanced Micro Devices , Inc.
Farrokh Hashem
Zagorin O'Brien Graham LLP
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