4. Electrical computers and digital processing systems: memory
  5. Storage accessing and control
  6. Hierarchical memories

Michael D. Bienek

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Built-in self timing test method and apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method and apparatus to achieve more level thermal gradient

Electrical computers and digital processing systems: memory – Storage accessing and control – Hierarchical memories
Reexamination Certificate

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Multipurpose test chip input/output circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Gating – Diverging with single input and plural outputs
Reexamination Certificate

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Zoned thermal monitoring

Oscillators – With device responsive to external physical condition – Temperature or light responsive
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Profile ID: LFUS-PAI-P-2303115

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