Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent
1997-01-29
2000-06-13
De Cady, Albert
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
G01R 3128, G06F 1100
Patent
active
060761792
ABSTRACT:
The present invention provides a method and apparatus for increasing the vector rate of an integrated circuit test system and simplifying the wiring of the tester to the device under test. The tester incorporates circuitry that allows the CPU to remap assignments of tester channels in the CPU address space during testing.
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Hendricks Matthew C.
Swan Richard
Altera Corporation
Cady Albert De
Chase Shelly A.
Kulas Charles J.
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