Optics: measuring and testing – Photometers
Reexamination Certificate
2011-04-26
2011-04-26
Stafira, Michael P (Department: 2886)
Optics: measuring and testing
Photometers
C356S614000
Reexamination Certificate
active
07933009
ABSTRACT:
Embodiments of methods and apparatus for detecting the proper position of a substrate in a chamber are provided herein. In some embodiments, a substrate position detection apparatus includes a substrate support having a plurality of lift pins for supporting a substrate in an elevated position thereover; a light source for directing a beam of light upon a reflective upper surface of the substrate; and a light sensor for detecting a reflected beam of light from the upper surface of the substrate upon the substrate being aligned in a predetermined elevated position.
REFERENCES:
patent: 5844683 (1998-12-01), Pavloski et al.
patent: 5980194 (1999-11-01), Freerks et al.
patent: 6231716 (2001-05-01), White et al.
patent: 6471464 (2002-10-01), Fay et al.
patent: 7012672 (2006-03-01), Van Rhee et al.
patent: 61-170605 (1986-08-01), None
patent: 08-203819 (1996-08-01), None
International Search Report and Written Opinion mailed Oct. 6, 2008 for PCT Application No. PCT/US08/70486.
Hunter Aaron
Lerner Alexander
Ranish Joseph M.
Serebryanov Oleg
Applied Materials Inc.
Moser IP Law Group
Stafira Michael P
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