Method and apparatus for using clustering method to analyze...

Details Method and apparatus for using clustering method to analyze... Method and apparatus for using clustering method to analyze...

2007-03-27

2007-03-27

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Measured signal processing

C382S145000, C702S179000

Reexamination Certificate

active

10817300

ABSTRACT:
A method for analyzing a semiconductor device tests a semiconductor device to produce first and second data. A clustering method is applied to the first data, creating a clustered first data. The clustered first data is then correlated with the second data to determine analyzed data.

REFERENCES:
patent: 5982920 (1999-11-01), Tobin et al.
patent: 6397166 (2002-05-01), Leung et al.
patent: 2002/0145430 (2002-10-01), Arai et al.

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