Method and apparatus for testing multi-core microprocessors

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S734000, C714S030000

Reexamination Certificate

active

07610537

ABSTRACT:
A computer implemented method, data processing system, and computer usable code are provided for testing multi-core microprocessors. A test process initiates testing on communication bus interfaces associated with a set of processor cores on the multiprocessor in which the communication bus interfaces are disabled and wherein the testing uses a set of isolation test sequences to obtain results. The process identifies a set of functional processor cores in the set of processor cores based upon the results. The process also initiates a ramp logic built-in self-test to test a ramp associated with a functional processor core in the set of functional processor cores, wherein the ramp logic built-in self-test determines if the communication bus interface associated with functional processor core in the set of functional processor cores is functional.

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patent: 2006/0200719 (2006-09-01), Keller
Pham et al., Overview of the Architecture, Circuit Design, and Physical Implementation of a First-Generation Cell Processor, Jan. 2006,IEEE, vol. 41, No. 1, pp. 179-196.
U.S. Appl. No. 11/295,057, filed Dec. 6, 2005, Kiryuk et al.

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