Method and apparatus for testing embedded cores

Details Method and apparatus for testing embedded cores Method and apparatus for testing embedded cores

2007-12-25

2007-12-25

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S006130, C714S025000, C714S030000, C714S042000, C714S718000, C714S723000, C714S733000, C714S734000, C365S201000

Reexamination Certificate

active

10335149

ABSTRACT:
Testing memory devices. An apparatus may include a test module operative to perform a test on a plurality of pipelined memory elements and a fail trace module operative to interrupt the test in response to identifying a failure of a memory element and to store an address of said memory element in a storage unit.

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