Method and apparatus for testing an IC device based on...

Details Method and apparatus for testing an IC device based on... Method and apparatus for testing an IC device based on...

2006-10-31

2009-11-24

Ellis, Kevin L (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S055000, C714S700000, C714S815000, C702S089000, C702S125000, C702S176000, C702S177000, C716S030000

Reexamination Certificate

active

07624323

ABSTRACT:
An apparatus for testing an IC device includes a test signal generator for generating a predefined sequence of test signals that are input to the IC device. A timing skew monitor is provided for monitoring the test signals input in the IC device and a signal output from the IC device for a predetermined time period, and creating an array indicating an execution or a nonexecution of signal timing combinations of one of the test signals relative to at least one of the other test signals within the predetermined time period by the IC device. A determination as to whether the desired signal timing combinations of the test signals have been executed by the IC device is made by an operator.

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