Method and apparatus for secure scan testing

Details Method and apparatus for secure scan testing Method and apparatus for secure scan testing

2007-02-27

2007-02-27

Torres, Joseph D. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C326S016000

Reexamination Certificate

active

10135877

ABSTRACT:
A processor, scan controller, and method for protecting sensitive information from electronic hacking is disclosed. To maintain the security of the sensitive data present in a processor, the scan controller denies access to the scan chain until data is cleared from scan-observable portions of the processor, then clears the scan chain again prior to exiting test mode and resuming normal operation. Clearing or otherwise modifying data stored in the scan-observable portions of a processor when transitioning to and/or from a test mode will prevent unauthorized personnel from simply shifting secure data out of the scan chain, and from pre-loading data into the scan chain prior to normal operation in an attempt to set sensitive state information.

REFERENCES:
patent: 4947357 (1990-08-01), Stewart et al.
patent: 5163155 (1992-11-01), Omiya
patent: 5347523 (1994-09-01), Khatri et al.
patent: 5530749 (1996-06-01), Easter et al.
patent: 5627842 (1997-05-01), Brown et al.
patent: 5757819 (1998-05-01), Segars
patent: 5898776 (1999-04-01), Apland et al.
patent: 6061010 (2000-05-01), Adams et al.
patent: 6216251 (2001-04-01), McGinn
patent: 6304099 (2001-10-01), Tang et al.
patent: 6539511 (2003-03-01), Hashizume
patent: 6754862 (2004-06-01), Hoyer et al.
patent: 2003/0126531 (2003-07-01), Tu et al.

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