Method and apparatus for scan testing dynamic circuits

Details Method and apparatus for scan testing dynamic circuits Method and apparatus for scan testing dynamic circuits

1997-11-26

1999-11-02

Beausoliel, Jr., Robert W.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

714733, G01R 3128

Patent

active

059789441

ABSTRACT:
A method and apparatus comprising a first circuit configured to receive a mode signal and generate a first signal and a second signal, the first circuit being configured to deassert the first signal and the second signal when the mode signal is in a first state; a first scan cell configured to latch a first input in response to the first signal and to latch a second input in response to a third signal to produce a first latched signal on a first output, the first scan cell configured to drive a second output in response to a fourth signal, wherein the second input and the second output are coupled to a scan chain; a dynamic circuit having a dynamic node, the dynamic circuit being configured to receive the first output and the second signal, to precharge the dynamic node in response to the second signal being deasserted, and produce a data on the third output in response to the second signal being asserted and the state of the dynamic node; and a second cell configured to latch the data in response to the second signal being deasserted.

REFERENCES:
patent: 5220281 (1993-06-01), Matsuki
patent: 5513187 (1996-04-01), Zepp
patent: 5606565 (1997-02-01), Edler et al.
patent: 5619157 (1997-04-01), Kumata et al.
patent: 5619511 (1997-04-01), Sugisawa et al.
patent: 5654658 (1997-08-01), Kubata et al.
patent: 5751727 (1998-05-01), Martens
PCT Search Report, International Application No.: PCT/US98/17948, mailed Nov. 9, 1998, 4pgs.

Affiliated with

Also associated with

Rating

Method and apparatus for scan testing dynamic circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for scan testing dynamic circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for scan testing dynamic circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2151324