Method and apparatus for reducing the time required to test an i

Details Method and apparatus for reducing the time required to test an i Method and apparatus for reducing the time required to test an i

1998-03-30

2000-06-27

Moise, Emmanuel L.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

714745, 324503, 326 16, 326 30, 326 87, 327108, G01R 3128

Patent

active

060819154

ABSTRACT:
Method and apparatus for reducing the time required to test an integrated circuit (10) using slew rate control. Using a very slow slew rate during normal operation may reduce electromagnetic interference, while using a faster slew rate during testing may reduce the test costs. In one embodiment, terminal control circuitry (40) includes a fast test control bit (50) to select a slow slew rate during normal operation, to select a faster slew rate during functional testing, and to optionally select a variety of slew rates during a special test to more fully characterize the behavior of integrated circuit (10). In one embodiment, each pre-driver circuit (80, 81) includes a low resistance device (61, 63) which may be selectively enabled or disabled to join with capacitors (66, 67) in output driver (82) to affect the slew rate of the signal driven as an output by integrated circuit terminal (83).

REFERENCES:
patent: 3868519 (1975-02-01), Green
patent: 4719369 (1988-01-01), Asan et al.
patent: 4761647 (1988-08-01), Hallenbeck et al.
patent: 4857863 (1989-08-01), Ganger et al.
patent: 4906867 (1990-03-01), Petty
patent: 5039874 (1991-08-01), Anderson
patent: 5066858 (1991-11-01), Elings et al.
patent: 5162672 (1992-11-01), McMahan et al.
patent: 5294845 (1994-03-01), McMahan et al.
patent: 5376848 (1994-12-01), Hanke, III et al.
patent: 5428770 (1995-06-01), Garner
patent: 5444402 (1995-08-01), McMahon et al.
patent: 5448182 (1995-09-01), Countryman et al.
patent: 5629643 (1997-05-01), Moughanni et al.
patent: 5870591 (1999-02-01), Sawada

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