Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2004-03-26
2010-12-07
Duncan, Marc (Department: 2113)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C700S121000
Reexamination Certificate
active
07849366
ABSTRACT:
A method includes receiving fault classification data associated with a fault condition and estimating at least one yield parameter based on the fault classification data. A system includes a fault classification unit and a yield estimation unit. The fault classification unit is adapted to generate fault classification data associated with a fault condition, and the yield estimation unit is adapted to estimate at least one yield parameter based on the fault classification data.
REFERENCES:
patent: 3751647 (1973-08-01), Maeder et al.
patent: 5777901 (1998-07-01), Berezin et al.
patent: 6169960 (2001-01-01), Ehrichs
patent: 6265232 (2001-07-01), Simmons
patent: 6311139 (2001-10-01), Kuroda et al.
patent: 6389323 (2002-05-01), Yang et al.
patent: 6496958 (2002-12-01), Ott et al.
patent: 6542830 (2003-04-01), Mizuno et al.
patent: 6610550 (2003-08-01), Pasadyn et al.
patent: 6751519 (2004-06-01), Satya et al.
patent: 6947806 (2005-09-01), Wang
patent: 7117057 (2006-10-01), Kuo et al.
patent: 2003/0060916 (2003-03-01), Hsieh
patent: 2004/0029029 (2004-02-01), Atkinson et al.
patent: 2007/0118242 (2007-05-01), Stine et al.
Advanced Micro Devices , Inc.
Duncan Marc
Williams Morgan & Amerson P.C.
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