Method and apparatus for performing scan testing

Details Method and apparatus for performing scan testing Method and apparatus for performing scan testing

1996-12-26

2000-02-29

Beausoliel, Jr., Robert W.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

365201, G01R 3128

Patent

active

060322780

ABSTRACT:
A method and apparatus for providing a scan cell having a first input coupled to receive a data, a data output and a scan output. The scan cell being capable of transferring data to said scan output in response to a first scan clock and a second scan clock without requiring any timing-sensitive control signals.

REFERENCES:
patent: 5459736 (1995-10-01), Nakamura
patent: 5477545 (1995-12-01), Huang
patent: 5519714 (1996-05-01), Nakamura et al.
patent: 5610927 (1997-03-01), Segars
patent: 5617426 (1997-04-01), Koenemann et al.
patent: 5619511 (1997-04-01), Sugisawa et al.
patent: 5663966 (1997-09-01), Day et al.
patent: 5719877 (1998-02-01), Warren
patent: 5719878 (1998-02-01), Yu et al.

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