Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent
1998-01-21
2000-08-15
De Cady, Albert
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
714735, 714737, 714738, G01R 3128
Patent
active
061051551
ABSTRACT:
A method and apparatus in which on-chip functions are checked and any detected anomalies are located within a nested time interval. An on-chip function is tested by (1) applying a predetermined data pattern to the function, (2) computing a linear block error detection code residue from any output from the function being tested, and (3) comparing the residue to a error code residue (signature) derived from the output of a copy of the same function with the same data pattern. In one embodiment, the code signature has been previously derived from an error-free copy of the function. Where the signature is supplied contemporaneously by another copy of the same function also being tested, the function copy is not presumed error free. In both cases, any mismatch between the on-chip code residue and the signature indicates error, erasure, or fault. By either recursive reprocessing or shortening the intervals between comparisons, the mismatch can be located within a nested time or sequence interval.
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Cheng Joe-Ming
Singh Shanker
Brodie R. Bruce
Cady Albert De
Gill William D.
Greene Jason
International Business Machines - Corporation
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