Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2006-05-23
2006-05-23
Nguyen, Tuan H. (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S088000
Reexamination Certificate
active
07049632
ABSTRACT:
Optical transducers disposed on an integrated circuit correspond to test points thereon. The state of optical transducers perceived by an optical sensor is correlated to test points. Alignment of the optical sensor relative to the optical transducers is accomplished electronically or mechanically.
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patent: 2004/0117142 (2004-06-01), Pillai
Erlenborn Mark J.
Gemar Jeff R.
Harper George
Kind Keith A.
Malpass Welborn R.
Mindspeed Technologies Inc.
Nguyen Tuan H.
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