4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Including specific communication means

George Harper

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Method and apparatus for optical probing of integrated...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Method and apparatus for telemetered probing of integrated...

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2824573

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