Method and apparatus for memory self testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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C714S719000, C714S720000

Reexamination Certificate

active

10025816

ABSTRACT:
A self-test controller10is responsive to scanned in self-test instructions to carry out test operations including generating a sequence of memory addresses that is specified by the self-test instruction. Combining multiple such self-test instructions allows a custom test methodology to be built up by a user using a generic self-test controller10.

REFERENCES:
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patent: 5633877 (1997-05-01), Shephard, III et al.
patent: 5661732 (1997-08-01), Lo et al.
patent: 6001662 (1999-12-01), Correale et al.
patent: 2001/0011904 (2001-08-01), Kaiser et al.
patent: 2003/0167428 (2003-09-01), Gold
patent: 0 472 818 (1992-03-01), None

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