Chemistry: electrical and wave energy – Apparatus – Electrolytic
Reexamination Certificate
2003-03-04
2010-11-30
King, Roy (Department: 1793)
Chemistry: electrical and wave energy
Apparatus
Electrolytic
C204S228100, C204S228900, C204S260000, C204S272000, C205S640000, C205S641000, C205S646000
Reexamination Certificate
active
07842169
ABSTRACT:
A method and apparatus for local polishing and deposition control in a process cell is generally provided. In one embodiment, an apparatus for electrochemically processing a substrate is provided that selectively polishes discrete conductive portions of a substrate by controlling an electrical bias profile across a processing area, thereby controlling processing rates between two or more conductive portions of the substrate.
REFERENCES:
patent: 3942959 (1976-03-01), Markoo et al.
patent: 3992178 (1976-11-01), Markoo et al.
patent: 4839993 (1989-06-01), Masuko et al.
patent: 5061294 (1991-10-01), Harmer et al.
patent: 5096550 (1992-03-01), Mayer et al.
patent: 5108463 (1992-04-01), Buchanan
patent: 5562529 (1996-10-01), Kishii et al.
patent: 5637031 (1997-06-01), Chen
patent: 5766446 (1998-06-01), Spindt et al.
patent: 5766466 (1998-06-01), Peterson
patent: 5823854 (1998-10-01), Chen
patent: 5911619 (1999-06-01), Uzoh et al.
patent: 5966151 (1999-10-01), Wakahara
patent: 5985093 (1999-11-01), Chen
patent: 6051116 (2000-04-01), Ichinose et al.
patent: 6056851 (2000-05-01), Hsieh et al.
patent: 6068818 (2000-05-01), Ackley et al.
patent: 6074284 (2000-06-01), Tani et al.
patent: 6141027 (2000-10-01), Akutsu et al.
patent: 6183354 (2001-02-01), Zuniga et al.
patent: 6190494 (2001-02-01), Dow
patent: 6261433 (2001-07-01), Landau
patent: 6319420 (2001-11-01), Dow
patent: 6358118 (2002-03-01), Boehm et al.
patent: 6368190 (2002-04-01), Easter et al.
patent: 6379223 (2002-04-01), Sun et al.
patent: 6395152 (2002-05-01), Wang
patent: 6402925 (2002-06-01), Talieh
patent: 6431968 (2002-08-01), Chen et al.
patent: 6440295 (2002-08-01), Wang
patent: 6479962 (2002-11-01), Ziemkowski et al.
patent: 6537144 (2003-03-01), Tsai et al.
patent: 6612904 (2003-09-01), Boehm et al.
patent: 6666959 (2003-12-01), Uzoh et al.
patent: 6736952 (2004-05-01), Emesh
patent: 6739951 (2004-05-01), Sun et al.
patent: 6776693 (2004-08-01), Duboust et al.
patent: 6802955 (2004-10-01), Emesh et al.
patent: 2001/0027018 (2001-10-01), Molnar
patent: 2002/0108861 (2002-08-01), Emesh et al.
patent: 2002/0123300 (2002-09-01), Jones et al.
patent: 2003/0104762 (2003-06-01), Sato et al.
patent: 2003/0129927 (2003-07-01), Lee et al.
patent: 2003/0209448 (2003-11-01), Hu et al.
patent: 2003/0213703 (2003-11-01), Wang et al.
patent: 2004/0023610 (2004-02-01), Hu et al.
patent: 3413762 (1983-05-01), None
patent: 0 325 753 (1989-08-01), None
patent: 0 455 455 (1991-06-01), None
patent: 1 103 346 (2001-05-01), None
patent: 1 103 346 (2001-05-01), None
patent: 1103346 (2001-05-01), None
patent: 2 214 520 (1989-09-01), None
patent: 10-16213 (1998-01-01), None
patent: 2870537 (1999-01-01), None
patent: 11-042554 (1999-02-01), None
patent: 2000-218513 (2000-08-01), None
patent: 2001-77117 (2001-03-01), None
patent: 2001196335 (2001-07-01), None
patent: 2001-244223 (2001-09-01), None
patent: 2002093761 (2002-03-01), None
patent: 2002520850 (2002-07-01), None
patent: 2004209588 (2004-07-01), None
patent: WO-98-49723 (1998-11-01), None
patent: WO-99-41434 (1999-08-01), None
patent: WO 99/53119 (1999-10-01), None
patent: WO-00-03426 (2000-01-01), None
patent: WO-00-26443 (2000-05-01), None
patent: WO 2004/024394 (2000-05-01), None
patent: WO-00-33356 (2000-06-01), None
patent: WO-00-59682 (2000-10-01), None
patent: WO-01-13416 (2001-02-01), None
patent: WO-01-49452 (2001-07-01), None
patent: WO-01-52307 (2001-07-01), None
patent: WO-01-63018 (2001-08-01), None
patent: WO-01-71066 (2001-09-01), None
patent: WO-01-88229 (2001-11-01), None
patent: WO-01-88954 (2001-11-01), None
patent: WO 02/23616 (2002-03-01), None
patent: WO 02/64314 (2002-08-01), None
patent: WO 03/001581 (2003-01-01), None
patent: WO 03/061905 (2003-07-01), None
PCT Notification of Transmittal of the International Search Report for PCT/US04/006385 dated May 17, 2005.
PCT Written Opinion for PCT/US04/006385 dated May 17, 2005.
D. Landolt, “Fundamental Aspects of Electropolishing”, Mar. 18, 1996, pp. 1-11.
Partial International Search Report for US 02/40754 dated Apr. 28, 2003.
PCT International Preliminary Examination Report for PCT/US02/04806, dated Sep. 7, 2004.
PCT International Preliminary Examination Report for PCT/US03/06058, dated Sep. 7, 2004.
PCT International Search Report for US 02/04806 dated Apr. 1, 2003.
PCT International Search Report for US 03/06058 dated Jun. 25, 2003.
PCT Written Opinion for PCT/US02/04806, dated Mar. 9, 2004.
PCT Written Opinion for PCT/US03/06058, dated Feb. 13, 2004.
PCT International Search Report for PCT/US 02/11009 dated Feb. 6, 2003.
PCT International Search Report for PCT/US03/01760 dated May 27, 2003.
PCT International Search Report for PCT/US03/29230 dated Feb. 3, 2004.
PCT International Search Report dated Mar. 30, 2005 for PCT/US2004/007501.
PCT Written Opinion dated Mar. 30, 2005 for PCT/US2004/007501.
PCT Partial International Search Report for PCT/US04/006385 dated Mar. 22, 2005.
Contolini “Electrochemical Planarization of ULSI Copper,” Solid State Technology; vol. 40, No. 6, Jun. 1, 1997, pp. 155-156, 158, 160, 162.
Nogami “An Innovation to Integrate Porous Low-K Materials and Copper”, InterConnect Japan 2001; Honeywell Seminar (Dec. 6, 2001); pp. 1-12.
Alexander, et al., “Electrically Conductive Polymer Nanocomposite Materials,” www.afrlhorizons.com/Briefs/Sept02/ML0206.html, Date Unknown.
PCT Written Opinion for PCT/US03/01760 dated Mar. 8, 2004.
PCT International Preliminary Report on Patentability dated Sep. 22, 2005 for PCT/US04/006385.
PCT Written Opinion dated Sep. 22, 2005 for PCT/US04/006385.
Office Action dated Feb. 16, 2010 for Japanese Patent Application No. 2006-509008.
Official Letter dated Mar. 1, 2010 for Taiwan Patent Application No. 93105760.
First Office Action for Chinese Patent Application No. 200480005812X issued Mar. 13, 2009.
Chen Liang-Yuh
Duboust Alain
Liu Feng Q.
Mavliev Rashid
Tsai Stan
Applied Materials Inc.
King Roy
Patterson & Sheridan LLP
Zheng Lois
LandOfFree
Method and apparatus for local polishing control does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for local polishing control, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for local polishing control will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4212358