Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Patent
1997-04-28
1998-05-19
Berman, Jack I.
Radiant energy
Inspection of solids or liquids by charged particles
Positive ion probe or microscope type
250308, 250307, H01J 37252, G01N 23225
Patent
active
057539146
ABSTRACT:
An improved method is disclosed which investigates the surface layer of a material. A pulsed slow positron beam having a pulse duration in a nanosecond range is focused and irradiated on the reverse surface of a thin-film-like sample, and a probe is brought into contact with the front surface of the sample. Surface positrons are swarmed in a gap space at the contact point so as to form positronium molecules Ps.sub.n (n is an integer equal to or greater than 2). Coherent annihilation gamma-rays generated due to annihilation of the positronium molecules Ps.sub.n are detected so as to discriminate the positronium molecules Ps.sub.n from positrons and positroniums Ps, thereby measuring on an atomic scale the physical properties of the surface layer of the material with a response time shorter than 1 nanosecond. This method makes it possible to measure on an atomic scale the state of local electrons at a surface layer of a material and activities at the surface layer, such as catalytic activity, with a response time shorter than 1 nanosecond.
REFERENCES:
patent: 5063293 (1991-11-01), Rich et al.
patent: 5159195 (1992-10-01), Van House
patent: 5200619 (1993-04-01), Asokakumar et al.
Berman Jack I.
Japan Science and Technology Corporation
LandOfFree
Method and apparatus for investigating the physical properties o does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for investigating the physical properties o, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for investigating the physical properties o will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1855163