Method and apparatus for implementing scaled device tests

Details Method and apparatus for implementing scaled device tests Method and apparatus for implementing scaled device tests

2007-06-29

2010-10-26

Le, John H (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Quality evaluation

C324S073100, C324S1540PB, C324S765010, C702S118000, C714S733000

Reexamination Certificate

active

07822567

ABSTRACT:
A method includes defining a hierarchy of test routines in a test program for testing integrated circuit devices. A first device is tested at a first screening level in the hierarchy. The first device is tested at a second detailed level in the hierarchy responsive to the first device failing the testing at the first screening level.

REFERENCES:
patent: 5206582 (1993-04-01), Ekstedt et al.
patent: 5418452 (1995-05-01), Pyle
patent: 6728916 (2004-04-01), Chen et al.
patent: 7112979 (2006-09-01), Arabi et al.

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