Semiconductor apparatus

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S328000, C257S330000, C257S342000, C257SE29262

Reexamination Certificate

active

07859052

ABSTRACT:
A semiconductor apparatus includes: a first first-conductivity-type semiconductor layer; a second first-conductivity-type semiconductor layer provided on a major surface of the first first-conductivity-type semiconductor layer; a third second-conductivity-type semiconductor layer forming a periodic array structure in combination with the second first-conductivity-type semiconductor layer in a lateral direction generally parallel to the major surface of the first first-conductivity-type semiconductor layer; and a sixth first-conductivity-type semiconductor layer provided on the major surface of the first first-conductivity-type semiconductor layer in a termination section outside the periodic array structure. The second first-conductivity-type semiconductor layer has an impurity concentration varying in the lateral direction and the impurity concentration is minimized at a center in the lateral direction. An impurity concentration in the sixth first-conductivity-type semiconductor layer is not higher than the impurity concentration at the center of the second first-conductivity-type semiconductor layer.

REFERENCES:
patent: 5216275 (1993-06-01), Chen
patent: 6677626 (2004-01-01), Shindou et al.
patent: 6693338 (2004-02-01), Saitoh et al.
patent: 2005/0017292 (2005-01-01), Onishi et al.
patent: 2005/0242411 (2005-11-01), Tso
patent: 2005/0280086 (2005-12-01), Saito et al.
patent: 2006/0124997 (2006-06-01), Yamauchi et al.
patent: 2006/0157813 (2006-07-01), Saito et al.
patent: 2006/0197152 (2006-09-01), Tokano et al.
patent: 2001-127289 (2001-05-01), None
patent: 2004-273742 (2004-09-01), None

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