Method and apparatus for generating test vectors for an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S742000, C714S725000, C714S726000, C714S727000, C714S025000, C714S724000, C714S741000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C703S015000, C703S020000

Reexamination Certificate

active

07496820

ABSTRACT:
Method, apparatus, and computer readable medium for generating test vectors for an integrated circuit (IC) under test is described. In one example, a test function is specified using at least one elementary function that encapsulates program code associated with an architecture of the IC under test. An engine is configured with device description data for the IC under test. The engine is executed with the test function as parametric input to generate the test vectors. In one example, the IC under test comprises a programmable logic device (PLD) and the test vectors include configuration data for configuring a pattern in the PLD and at least one test vector for exercising the pattern. The test vectors may be applied directly to the device or through automatic test equipment (ATE). Alternatively, the test vectors may be applied to a IC design simulation of the device.

REFERENCES:
patent: 6341361 (2002-01-01), Basto et al.
patent: 7137087 (2006-11-01), Mohanty et al.
patent: 7373621 (2008-05-01), Dastidar
patent: 2002/0173942 (2002-11-01), Rajsuman et al.
patent: 2004/0153928 (2004-08-01), Rohrbaugh et al.
patent: 2004/0187060 (2004-09-01), Rohrbaugh et al.
patent: 2004/0250191 (2004-12-01), Leaming

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for generating test vectors for an... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for generating test vectors for an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for generating test vectors for an... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4125094

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.