Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent
1997-12-02
2000-05-09
Nguyen, Hoa T.
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
714728, 364717, G01R 3128
Patent
active
060618175
ABSTRACT:
A method and apparatus for generating a serial test pattern for sequence detection. The serial test pattern has a first plurality of bits and is generated by a pattern generator. A second plurality of bits is generated having a first value. The second plurality of bits includes less bits than the first plurality of bits. The first value of the second plurality of bits is then compared with one or more numbers to generate a comparison result. A next bit is then generated in the serial pattern based upon the comparison result and one or more bits of the second plurality of bits.
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Higginson Peter L.
Jones Christopher W.
Cypress Semiconductor Corp.
Maiorana P.C. Christopher P.
Nguyen Hoa T.
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