Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2005-01-25
2009-08-04
Lee, Hsien-ming (Department: 2823)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C438S781000, C438S788000, C438S790000, C438S795000, C257SE21269, C257SE21274
Reexamination Certificate
active
07569497
ABSTRACT:
In a method for forming an insulating film, a film containing an organic curable material and provided on a substrate for an electronic device is irradiated with an energy plasma produced by a microwave irradiation through a planar antenna member having a plurality of slits to thereby cure the film containing the organic curable material and form the insulating film having a dielectric constant of 3 or less.
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Patent Abstracts of Japan, JP 57-103333, Jun. 26, 1982.
Hongoh Toshiaki
Hoshino Satohiko
Lee Hsien-ming
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tokyo Electron Limited
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