Method and apparatus for extending lifetime reliability of...

Details Method and apparatus for extending lifetime reliability of... Method and apparatus for extending lifetime reliability of...

2008-06-24

2008-06-24

Tan, Vibol (Department: 2819)

Electronic digital logic circuitry

Signal sensitivity or transmission integrity

Signal level or switching threshold stabilization

C326S034000, C326S095000, C326S098000, C327S537000, C327S534000

Reexamination Certificate

active

07391233

ABSTRACT:
An apparatus for extending lifetime reliability of CMOS circuitry includes a first switching device between a logic high supply rail/logic low supply rail, and a virtual supply rail coupled to the CMOS circuitry. In a first mode of operation the first switching device supplies the full voltage value between the logic high supply rail and the logic low supply rail, and in a second mode of operation, the first switching device isolates the virtual supply rail from the logic high supply rail/logic low supply rail, thereby reducing the voltage supplied to the CMOS circuitry. A second switching device coupled between the virtual supply rail and the logic low supply rail/logic high supply rail, in a third mode of operation, equalizes the voltage on the virtual supply rail and the logic low supply rail/logic high supply rail.

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