Method and apparatus for extending lifetime reliability of...

Details Method and apparatus for extending lifetime reliability of... Method and apparatus for extending lifetime reliability of...

2008-06-24

2008-06-24

Tan, Vibol (Department: 2819)

Electronic digital logic circuitry

Signal sensitivity or transmission integrity

Signal level or switching threshold stabilization

C326S034000, C326S095000, C326S098000, C327S537000, C327S534000

Reexamination Certificate

active

07391232

ABSTRACT:
An apparatus for extending lifetime reliability of CMOS circuitry includes a logic high supply rail, a logic low supply rail, and a virtual supply rail. In an intense recovery mode of operation, a first switching device is rendered nonconductive so as to isolate the virtual supply rail from the one of the logic high supply rail and the logic low supply rail, and the second switching device is rendered conductive so as to equalize the voltage on the virtual supply rail and the other of the logic high supply rail and the logic low supply rail. At least one device within the circuitry provides one of the logic high voltage and the logic low voltage to a gate terminal of an FET within the circuitry, with a source terminal of the FET coupled to the virtual supply rail, such that the FET is subjected to a reverse bias condition.

REFERENCES:
patent: 6307234 (2001-10-01), Ito et al.
patent: 6559708 (2003-05-01), Notani
patent: 7190209 (2007-03-01), Kang et al.
patent: 7215155 (2007-05-01), Won
patent: 2006/0076987 (2006-04-01), Won
patent: 2006/0077002 (2006-04-01), White
patent: 2006/0172715 (2006-08-01), Carballo et al.
patent: 2007/0007997 (2007-01-01), Kim et al.
patent: 2007/0063763 (2007-03-01), Yoo et al.
patent: 2007/0075743 (2007-04-01), Oh

Affiliated with

Also associated with

Rating

Method and apparatus for extending lifetime reliability of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for extending lifetime reliability of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for extending lifetime reliability of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2804753