Method and apparatus for enhanced parallel port JTAG interface

Details Method and apparatus for enhanced parallel port JTAG interface Method and apparatus for enhanced parallel port JTAG interface

2006-05-02

2006-05-02

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07039839

ABSTRACT:
A method and apparatus for an enhanced parallel port JTAG interface (IEEE Test Access Port) that includes a clock signal line where the clock signal line is a delayed and inverted version of a data strobe signal line. A data input signal line, a data output signal line, a mode select signal line, and a wait signal line are also include. The wait signal line is a delayed and inverted version of the data strobe signal line. The enhanced JTAG cable is connectable between an Enhanced Parallel Port (EPP) and a JTAG port and has increased performance over using a Standard Parallel Port (SPP).

REFERENCES:
patent: 6002882 (1999-12-01), Garde
patent: 6009270 (1999-12-01), Mann
patent: 6185732 (2001-02-01), Mann et al.
patent: 6813674 (2004-11-01), Velasco et al.
“IEEE Standard Test Access Port and Boundary-Scan Architecture”, (IEEE Std. 1149.1-2001), Test Technology Standards Committee of the IEEE Computer Society, (2001), 208 pgs.
“Intel™ System Architecture”,PXA250and PXA210 Application Processors Developer's Manual, 2-1 through 3-1, 41 pgs.
“Warp Nine Engineering: EPP Mode”, http://www.fapo.com/eppmode.htm, (Observed Apr. 2, 2002), 4 pgs.

Affiliated with

Also associated with

Rating

Method and apparatus for enhanced parallel port JTAG interface does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for enhanced parallel port JTAG interface, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for enhanced parallel port JTAG interface will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3590016