Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-03-07
2010-11-09
Tabone, Jr., John J (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S740000, C714S742000, C324S765010, C327S512000, C327S548000, C331S066000, C374S170000, C713S164000
Reexamination Certificate
active
07831873
ABSTRACT:
An integrated circuit is used to monitor and process parametric variations, such as temperature and voltage variations. An integrated circuit may include a temperature-sensitive oscillator circuit and a temperature-insensitive oscillator circuit, and frequency difference between the two sources may be monitored. In some embodiments, a parametric-insensitive reference oscillator is used as a reference to measure frequency performance of a second oscillator wherein the second oscillator performance is parametric-sensitive. The measured frequency performance is then compared to a tamper threshold and the result of the comparison is indicative of tampering.
REFERENCES:
patent: 5668506 (1997-09-01), Watanabe et al.
patent: 6091255 (2000-07-01), Godfrey
patent: 6390672 (2002-05-01), Vail et al.
patent: 6614124 (2003-09-01), Brown et al.
patent: 6737925 (2004-05-01), Logue et al.
patent: 6778028 (2004-08-01), Kobayashi et al.
patent: 6784048 (2004-08-01), Leung et al.
patent: 6814048 (2004-08-01), Leung et al.
patent: 6814485 (2004-11-01), Gauthier et al.
patent: 7088172 (2006-08-01), Lesea et al.
patent: 7391274 (2008-06-01), Hsu
patent: 7619486 (2009-11-01), Lesea
patent: 2007/0218623 (2007-09-01), Chua et al.
Soohoo, Alex, Lockdown! Random Numbers Secure Network SoC Designs, Apr. 1, 2003, D&R Industry Articles, pp. 1-7.
U.S. Appl. No. 11/715,534, filed Mar. 7, 2007, Lesea, Austin, H., Xilinx, Inc. 2100 Logic Drive, San Jose, CA 95124.
New, Bernie et al., A 400-MHz Frequency Counter, Xilinx Xcell, The Quarterly Journal for Programmable Logic Users, Issue 32, Second Quarter, Apr. 30, 1999, pp. 47-49, Xilinx, Inc. 2100 Logic Drive, San Jose, CA 95124.
Lesea Austin H.
Trimberger Stephen M.
George Thomas
Liu Justin
Tabone, Jr. John J
Xilinx , Inc.
LandOfFree
Method and apparatus for detecting sudden... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for detecting sudden..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for detecting sudden... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4252354