Method and apparatus for deposition of low dielectric...

Coating apparatus – Gas or vapor deposition

Reexamination Certificate

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C156S345330, C156S345340

Reexamination Certificate

active

07008484

ABSTRACT:
A showerhead adapted for distributing gases into a process chamber and a method for forming dielectric layers on a substrate are generally provided. In one embodiment, a showerhead for distributing gases in a processing chamber includes an annular body coupled between a disk and a mounting flange. The disk has a plurality of holes formed therethrough. A lip extends from a side of the disk opposite the annular body and away from the mounting flange. The showerhead may be used for the deposition of dielectric materials on a substrate. In one embodiment, silicon nitride and silicon oxide layers are formed on the substrate without removing the substrate from a processing chamber utilizing the showerhead of the present invention.

REFERENCES:
patent: 4262631 (1981-04-01), Kubacki
patent: 4532150 (1985-07-01), Endo et al.
patent: 4634601 (1987-01-01), Hamakawa et al.
patent: 4759947 (1988-07-01), Ishihara et al.
patent: 5024748 (1991-06-01), Fujimura
patent: 5238866 (1993-08-01), Bolz et al.
patent: 5465680 (1995-11-01), Loboda
patent: 5685914 (1997-11-01), Hills et al.
patent: 5711987 (1998-01-01), Bearinger et al.
patent: 5728223 (1998-03-01), Murakami et al.
patent: 5730792 (1998-03-01), Camilletti et al.
patent: 5776235 (1998-07-01), Camilletti et al.
patent: 5780163 (1998-07-01), Camilletti et al.
patent: 5818071 (1998-10-01), Loboda et al.
patent: 6054379 (2000-04-01), Yau et al.
patent: 6072227 (2000-06-01), Yau et al.
patent: 6132512 (2000-10-01), Horie et al.
patent: 6140226 (2000-10-01), Grill et al.
patent: 6147009 (2000-11-01), Grill et al.
patent: 6159871 (2000-12-01), Loboda et al.
patent: 6287990 (2001-09-01), Cheung et al.
patent: 6303523 (2001-10-01), Cheung et al.
patent: 6340435 (2002-01-01), Bjorkman et al.
patent: 6454860 (2002-09-01), Metzner et al.
patent: 6627532 (2003-09-01), Gaillard et al.
patent: 0 613 179 (1994-08-01), None
U.S. Appl. No. 09/247,381, filed, Feb. 19, 2002, Cheung et al.
U.S. Appl. No. 09/338,470, filed, Jul. 2, 2002, Moghadam et al.
U.S. Appl. No. 09/370,371, filed, Jan. 28, 2003, Yau et al.
U.S. Appl. No. 09/465,233, filed Jan. 28, 2003, Yau et al.
U.S. Appl. No. 09/477,126, filed Dec. 30, 1999, Yau et al.
U.S. Appl. No. 09/553,461, filed Jul. 15, 2003, Huang et al.
U.S. Appl. No. 09/580,505, filed Mar. 25, 2003, Cheung et al.
U.S. Appl. No. 09/594,186, filed May 13, 2003, Cheung et al.
U.S. Appl. No. 09/594,187, filed Apr. 1, 2003, Cheung et al.
U.S. Appl. No. 09/957,551, filed Sep. 19, 2001, Cheung et al.
U.S. Appl. No. 09/957,681, filed Sep. 19, 2001, Cheung et al.
Xia, et al., “Silicon Carbide Cap Layers for Low Dielectric Constant Silicon Oxide Layers,” Filed Mar. 28, 2001, U.S Appl. 09/820,439.

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