Method and apparatus for defining mask patterns utilizing a...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S030000

Reexamination Certificate

active

06920628

ABSTRACT:
A method of generating a mask for use in printing a target pattern on a substrate. The method includes the steps of: (a) determining a target pattern representing a circuit design to be printed on a substrate; (b) generating a first pattern by scaling the target pattern by a factor of 0.5; and (c) generating a second pattern by performing a Boolean operation which combines the target pattern and the first pattern. The second pattern is then utilized to print the target pattern on the substrate.

REFERENCES:
patent: 5553273 (1996-09-01), Liebmann
patent: 5629113 (1997-05-01), Watanabe
patent: 5936868 (1999-08-01), Hall
patent: 6033812 (2000-03-01), Miyagawa
patent: 6114071 (2000-09-01), Chen et al.
patent: 6185727 (2001-02-01), Liebmann
patent: 6215546 (2001-04-01), Chu et al.
patent: 6373553 (2002-04-01), Singh
patent: 6482555 (2002-11-01), Chen et al.
patent: 6541167 (2003-04-01), Petersen et al.
patent: 6623895 (2003-09-01), Chen et al.
patent: 2002/0010904 (2002-01-01), Ayres
patent: 2002/0026624 (2002-02-01), Ono
patent: 2002/0051913 (2002-05-01), Broeke
patent: 1 174 764 (2002-01-01), None
patent: 8-286358 (1996-11-01), None
patent: 2000-112113 (2000-04-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for defining mask patterns utilizing a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for defining mask patterns utilizing a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for defining mask patterns utilizing a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3379116

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.