Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With measuring – sensing – detection or process control means
Reexamination Certificate
2005-10-07
2011-12-13
MacArthur, Sylvia R. (Department: 1716)
Adhesive bonding and miscellaneous chemical manufacture
Differential fluid etching apparatus
With measuring, sensing, detection or process control means
C361S234000, C279S128000, C118S724000
Reexamination Certificate
active
08075729
ABSTRACT:
A pedestal assembly and method for controlling temperature of a substrate during processing is provided. In one embodiment, the pedestal assembly includes an electrostatic chuck coupled to a metallic base. The electrostatic chuck includes at least one chucking electrode and metallic base includes at least two fluidly isolated conduit loops disposed therein. In another embodiment, the pedestal assembly includes a support member that is coupled to a base by a material layer. The material layer has at least two regions having different coefficients of thermal conductivity. In another embodiment, the support member is an electrostatic chuck. In further embodiments, a pedestal assembly has channels formed between the base and support member for providing cooling gas in proximity to the material layer to further control heat transfer between the support member and the base, thereby controlling the temperature profile of a substrate disposed on the support member.
REFERENCES:
patent: 5838528 (1998-11-01), Os et al.
patent: 5846375 (1998-12-01), Gilchrist et al.
patent: 6035101 (2000-03-01), Sajoto et al.
patent: 6129046 (2000-10-01), Mizuno et al.
patent: 6256187 (2001-07-01), Matsunaga et al.
patent: 6310755 (2001-10-01), Kholodenko et al.
patent: 6392205 (2002-05-01), Minonishi
patent: 6482747 (2002-11-01), Takahashi et al.
patent: 6606234 (2003-08-01), Divakar
patent: 6664738 (2003-12-01), Arai et al.
patent: 6677167 (2004-01-01), Kanno et al.
patent: 6793767 (2004-09-01), Chu et al.
patent: 6853533 (2005-02-01), Parkhe
patent: 7677199 (2010-03-01), Cho et al.
patent: 7886687 (2011-02-01), Lee et al.
patent: 2001/0054389 (2001-12-01), Sago et al.
patent: 2002/0021545 (2002-02-01), Tatsumi et al.
patent: 2002/0050246 (2002-05-01), Parkhe
patent: 2002/0092471 (2002-07-01), Kang et al.
patent: 2002/0170882 (2002-11-01), Akiba
patent: 2003/0089457 (2003-05-01), Nallan et al.
patent: 2003/0155079 (2003-08-01), Bailey et al.
patent: 2003/0164226 (2003-09-01), Kanno et al.
patent: 2003/0230551 (2003-12-01), Kagoshima et al.
patent: 2004/0061449 (2004-04-01), Arai et al.
patent: 2004/0115947 (2004-06-01), Fink et al.
patent: 2004/0185670 (2004-09-01), Hamelin et al.
patent: 2004/0187787 (2004-09-01), Dawson et al.
patent: 2004/0195216 (2004-10-01), Strang
patent: 2004/0212947 (2004-10-01), Nguyen et al.
patent: 2004/0261721 (2004-12-01), Steger
patent: 2005/0042881 (2005-02-01), Nishimoto et al.
patent: 2006/0076108 (2006-04-01), Holland et al.
patent: 2006/0076109 (2006-04-01), Holland et al.
patent: 2006/0158821 (2006-07-01), Miyashita
patent: 2007/0102118 (2007-05-01), Holland et al.
patent: 2007/0139856 (2007-06-01), Holland et al.
patent: 2007/0258186 (2007-11-01), Matyushkin et al.
patent: 2585414 (2003-11-01), None
patent: 091770 (1997-01-01), None
patent: 10209257 (1998-08-01), None
patent: 2001210581 (2001-08-01), None
patent: 2002009064 (2002-01-01), None
patent: 2003243490 (2003-08-01), None
patent: 2004-55779 (2005-09-01), None
patent: 508716 (2002-11-01), None
patent: 526521 (2003-04-01), None
patent: 582050 (2004-04-01), None
patent: 224634 (2004-12-01), None
patent: 225896 (2005-01-01), None
patent: WO-2006022997 (2006-03-01), None
Claims co-pending U.S. Appl. No. 11/740,869, filed Apr. 26, 2007.
Claims co-pending U.S. Appl. No. 11/778,019, filed Jul. 14, 2007.
Wait, R.K.. Monitoring residual and process gases in PVD processes: The Importance of sensitivity. Micromagazine, Jun. 1997.
Translation of Chinese Office Action for CN Application No. 200510116536.0, consists of 10 unnumbered pages.
International Search Report for PCT/US 06/07525.
Second Office Action for Chinese Application No. 200510116536.0, May 30, 2008, consists of seven pages (1-3 and 1-4) (APPM/9259 CN)—provides a concise explanation of relevance for B1.
Search Report dated Jul. 13, 2009 Taiwan Application No. 095107311. (APPM/009259 TAIW 02).
Official Letter dated Aug. 21, 2009 for Taiwan Patent Application No. 095107311. (APPM/009259 TAIW 02).
Official letter of Taiwanese Patent Application No. 094135006, dated Jun. 10, 2009. Provides translation of foreign reference, TW 508716 and TW 526521.
Notice of Reasons for Rejection letter of Japanese Application No. 2005-295533, dated Jul. 7, 2009.
Prosecution history of U.S. Appl. No. 10/960,874, filed Oct. 1, 2009.
Prosecution history of U.S. Appl. No. 11/367,004, filed Oct. 1, 2009.
Prosecution history of U.S. Appl. No. 11/531,474, filed Oct. 1, 2009.
Notice of Reasons For Rejection letter of Japanese Application No. P2005-295533, dated Nov. 10, 2009.
Official Letter dated May 14, 2010 from Chinese Patent Office for corresponding Chinese Patent application No. 200680006797.
Official letter of German Patent Application No. 11 2006000327.5-54, dated Aug. 25, 2010. English translation of foreign reference is provided.
Prosecution history of U.S. Appl. No. 11/531,474, filed Jan. 3, 2011.
Prosecution history of U.S. Appl. No. 11/367,004, filed Jan. 3, 2011.
Prosecution history of U.S. Appl. No. 10/960,874, filed Jan. 3, 2011.
Translation of Chinese Office Action for CN Application No. 200510116536.0, consists of 10 unnumbered pages, date of issue: Aug. 31, 2007.
International Search Report for PCT/US 06/07525, priority date Mar. 3, 2005.
Official Letter dated Sep. 5, 2008, from Chinese Patent Office for corresponding Chinese Patent Application No. 200680006797.X.
MICRO: Jun. 1997: Equipment Management Strategies, by Robert K. Waits (p. 81), “Monitoring residual and process gases in PVD processes: The improtance of sensitivity”.
Holland John
Panagopoulos Theodoros
Applied Materials Inc.
MacArthur Sylvia R.
Patterson & Sheridan L.L.P.
LandOfFree
Method and apparatus for controlling temperature of a substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for controlling temperature of a substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for controlling temperature of a substrate will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4255979