Static information storage and retrieval – Powering
Reexamination Certificate
2007-02-06
2007-02-06
Dinh, Son T. (Department: 2824)
Static information storage and retrieval
Powering
C365S189090, C365S189070, C327S374000
Reexamination Certificate
active
11327104
ABSTRACT:
The invention relates to a method and apparatus for controlling a high voltage generator during wafer burn-in. The method includes generating an enable signal for enabling a high voltage generator responsive to a mode signal, e.g., a wafer burn-in test mode. The method provides an external voltage to a semiconductor memory device through a pad responsive to the enable signal. The method varies a high voltage level being output from the high voltage generator in response to a reference voltage level.
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patent: 5796287 (1998-08-01), Furutani et al.
patent: 6372528 (2002-04-01), Yamamoto
patent: 6480426 (2002-11-01), Atsumi et al.
patent: 6700817 (2004-03-01), Atsumi et al.
Choi Jong-Hyun
Jung Yong-Hwan
Kang Sang-Seok
Kim Hyung-Dong
Park Choong-Sun
Dinh Son T.
Marger & Johnson & McCollom, P.C.
Samsung Electronics Co,. Ltd.
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