Method and apparatus for controlling a gas cluster ion beam...

Radiant energy – Irradiation of objects or material – Ion or electron beam irradiation

Reexamination Certificate

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C250S492100, C250S492200, C250S492210

Reexamination Certificate

active

07825389

ABSTRACT:
Methods and apparatus for controlling a gas cluster ion beam formed from a plurality of process gases in a gas mixture. The methods and apparatus involve measuring gas analysis data relating to the composition of the gas mixture and modifying the irradiation of the workpiece in response to the detected parameter. The gas analysis data can be derived from samples of the composition of the gas mixture flowing from a gas source to the gas cluster ion beam apparatus or samples of the residual gases inside the vacuum vessel of the gas cluster ion beam apparatus.

REFERENCES:
patent: 4361762 (1982-11-01), Douglas
patent: 4886971 (1989-12-01), Matsumura et al.
patent: 4916311 (1990-04-01), Fuzishita et al.
patent: 5814194 (1998-09-01), Deguchi et al.
patent: 6116080 (2000-09-01), Logue et al.
patent: 6297510 (2001-10-01), Farley
patent: 6750460 (2004-06-01), Greer
patent: 7057191 (2006-06-01), Hsu et al.
patent: 7067828 (2006-06-01), Swenson
patent: 7123361 (2006-10-01), Doughty
patent: 2002/0130275 (2002-09-01), Mack et al.
patent: 2005/0181621 (2005-08-01), Borland et al.
patent: 2005/0202657 (2005-09-01), Borland et al.
patent: 2005/0205802 (2005-09-01), Swenson et al.
patent: 2007/0075274 (2007-04-01), Reece et al.
patent: 168812 (2006-08-01), None
patent: 62296357 (1987-12-01), None
Hautala, “GCIB Process Development for Semiconductor Applications”, 4th Workshop on Cluster Ion Beam and Advanced Quantum Beam Process Technology, Tokyo, Japan, Sep. 2003 (7 pages).
European Patent Office, International Search Report issued in related international patent application serial No. PCT/US2008/083088 dated Aug. 10, 2009.
European Patent Office, Office Action issued in related European Application No. 03 749 734.4 dated Oct. 5, 2009.
European Patent Office, Office Action issued in related European Application No. 05 729 563.6 dated Sep. 24, 2009.
Yamada, et al., “Surface modification with gas cluster ion beams”, Nuclear Instruments and Methods in Physics Research B79 (1993) 223-226 North-Holland.
Saitoh, et al., “Acceleration of cluster and molecular ions by TIARA 3 MV tandem accelerator”, Nuclear Instruments and Methods in Physics Research A 452 (2000) 61-66).

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