Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2006-01-03
2006-01-03
Ton, David (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S736000
Reexamination Certificate
active
06983404
ABSTRACT:
Method and apparatus are disclosed for checking the resistance of antifuse elements in an integrated circuit. A voltage based on the resistance of an antifuse element is compared to a voltage based on a known resistance, and an output signal is generated whose binary value indicates whether the resistance of the antifuse element is higher or lower than the known value of resistance. The method and apparatus are useful in verifying the programming of antifuse elements.
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Beigel Kurt D.
Cutter Douglas J.
Debenham Brett M.
Ho Fan
Luong Dien
Fletcher Yoder P.C.
Micro)n Technology, Inc.
Ton David
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