Method and apparatus for built-in self-test (BIST) of...

Details Method and apparatus for built-in self-test (BIST) of... Method and apparatus for built-in self-test (BIST) of...

2007-09-11

2007-09-11

Tu, Christine T. (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S731000

Reexamination Certificate

active

10785826

ABSTRACT:
An integrated circuit device (200) can include a main portion (204) and a built-in self-test (BIST) portion (204) having outputs coupled to physical input structures (e.g., bond pads) (206) of the integrated circuit device (200). A BIST portion (202) can test timing critical parameters that take into account the effect of input structures (206). A BIST portion (202) can apply BIST test signals with a pipeline structure that can emulate timing parameters, such as a set-up time (Ts) and a clock-to-output time (Tco).

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WEBSTER'S II New Riverside University Dictionary, “couple”, The Riverside Publishing company, 1984.

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