Meta-data driven test-data generation with controllable...

Details Meta-data driven test-data generation with controllable... Meta-data driven test-data generation with controllable...

2006-08-21

2009-12-29

Tu, Christine T (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S025000, C704S004000

Reexamination Certificate

active

07640470

ABSTRACT:
Generation of test data for systems having functionality subject to a grammar or other sort of meta-data is automated by a controlled combinatorial approximation of naïve combinatorial coverage. A suite of control mechanisms are applied to an algorithm that generates test data to provide well-defined and understandable approximations of full combinatorial coverage.

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