Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2007-01-02
2007-01-02
Dinh, Son T. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S189050, C365S203000
Reexamination Certificate
active
11218135
ABSTRACT:
A memory (100) includes first (116) and second (118) sense amplifiers, a first logic gate (120), a first three-state driver (130), and a latch (180). The first sense amplifier (116) is coupled to a first local data line and has an output terminal for providing a signal indicative of a state of a selected memory cell on the first local data line. The second sense amplifier (118) is coupled to a second local data line and has an output terminal for providing a signal indicative of a state of a selected memory cell on the second local data line. The first three-state driver (130) has a data input terminal coupled to the output terminal of the first logic gate (120), a control input terminal for receiving a first select signal, and an output terminal coupled to a global data line. The latch (180) has an input/output terminal coupled to the global data line (170).
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Hunter Bradford L.
Zhang Shayan
Dinh Son T.
Freescale Semiconductor Inc.
Larson Newman Abel Polansky & White LLP
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