4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Wei-Chia Cheng

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Memory with improved BIST

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Method of specifying pin states for a memory chip

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Method of specifying pin states for a memory chip

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Programmable self-test for random access memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2293468

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