Memory with a combined global data line load and multiplexer

Static information storage and retrieval – Read/write circuit – Multiplexing

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Details

365177, 365190, 365208, 36523003, 36523006, G11C 700, G11C 11419

Patent

active

054756359

ABSTRACT:
A combined global data line load and multiplexer comprises a decoder, a bias generator circuit, at least one output signal line pair, and a plurality of switching portions. The decoder provides a plurality of select signals in response to a portion of an address, each select signal provided at either a logic high voltage or at a logic low voltage. For example, a X4 memory internally organized X8 uses one extra address bit to select between two sets of four global data line pairs to provide as outputs. The bias generator circuit provides a bias signal at a voltage between the logic high and the logic low voltages. The output signal lines are each coupled through a respective resistor to a power supply voltage terminal. Each switching portion provides substantially a differential current between corresponding global data lines to corresponding output signal lines in response to the bias voltage exceeding a voltage of a corresponding select signal.

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Matsui, et al, "High-Speed SRAMs", 1989 IEEE Solid State Circuits Conference, pp. 38-39.
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Burnett and Hu, "Hot-Carrier Degradation in Bipolar Transistors at 300 and 110 K-Effect on BiCl Inverter Performance"< IEEE Transactions on Electron Devices, vol. 37, No. 4, Apr. 1990, p. 11.

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