Memory testing

Details Memory testing Memory testing

2011-08-23

2011-08-23

Gaffin, Jeffrey A (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S733000

Reexamination Certificate

active

08006144

ABSTRACT:
This application discloses a data processing apparatus comprising: at least one memory; processing logic operable to perform data processing operations on data and operable to access said at least one memory; and memory testing logic operable to perform a transparent algorithm testing routine on said at least one memory, said data processing apparatus impeding said processing logic from accessing said at least one memory while said memory testing logic is performing said testing routine; wherein said processing logic and said memory testing logic are operable to detect a system event, said memory testing logic being operable when performing said testing routine to respond to detection of said system event by stopping said testing routine and restoring said at least one memory to an initial state, said initial state being a state it was in immediately prior to commencement of said testing routine, whereupon said data processing apparatus is operable to allow said processing logic to access said at least one memory.

REFERENCES:
patent: 5469445 (1995-11-01), Nicolaidis
patent: 5495491 (1996-02-01), Snowden et al.
patent: 5918248 (1999-06-01), Newell et al.
patent: 6415406 (2002-07-01), Kaiser et al.
patent: 2006/0212764 (2006-09-01), Slobodnik et al.
patent: 2 265 023 (1993-09-01), None
patent: 09-319729 (1997-12-01), None
patent: 2003-344489 (2003-12-01), None
UK Search Report for GB 0613557.8, date of search Sep. 18, 2006.
Karpovsky et al., “Transparent Memory BIST”, Proc IEEE int workshop Memory Tech Des., 1994, pp. 106-111.
Boutobza, et al. “A Transparent based Programmable Memory BIST”, 11thEuropean Test Symposium, May 21-24, 2006; pp. 89-96, IEEE Computer Society, 2006.

Affiliated with

Also associated with

Rating

Memory testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Memory testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory testing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2678383