Electrical computers and digital processing systems: memory – Storage accessing and control – Access timing
Reexamination Certificate
2005-09-13
2005-09-13
Moazzami, Nasser (Department: 2187)
Electrical computers and digital processing systems: memory
Storage accessing and control
Access timing
C711S168000, C714S718000, C714S744000, C365S194000, C365S233100
Reexamination Certificate
active
06944737
ABSTRACT:
Memory modules and methods of testing memory modules are provided that include at least one memory device responsive to a memory clock signal having a memory clock frequency and a data buffer. The data buffer is responsive to a buffer clock signal having a first buffer clock frequency that is different from the memory clock frequency during a normal mode of operation and having a second buffer clock frequency that is equal to the memory clock frequency during a test mode of operation.
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Ahn Young-man
So Byung-se
So Jin-ho
Moazzami Nasser
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
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