Memory module with testing logic

Details Memory module with testing logic Memory module with testing logic

2007-06-19

2007-06-19

Le, Dieu-Minh (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S733000

Reexamination Certificate

active

10771998

ABSTRACT:
A memory module that comprises a plurality of memory circuits, at least one serial presence detect (SPD) memory circuit, and a plurality of data lines that transfer data to and from the plurality of memory circuits. The memory module may further comprise a testing logic that utilizes data stored in the SPD memory circuit to inject a memory error into one or more of the plurality data lines.

REFERENCES:
patent: 4999837 (1991-03-01), Reynolds et al.
patent: 5008885 (1991-04-01), Huang et al.
patent: 5058112 (1991-10-01), Namitz et al.
patent: 6092146 (2000-07-01), Dell et al.
patent: 6519718 (2003-02-01), Graham et al.
patent: 6683372 (2004-01-01), Wong et al.
Mei-Chen Hsueh et al., “Fault Injection Techniques and Tools,” 1997 IEEE, Apr. 1997, pp. 75-82.

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