4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Including multiple test instruments

Tat Leung Lai

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Chip handler with a buffer traveling between roaming areas...

Data processing: measuring – calibrating – or testing – Testing system – Including multiple test instruments
Reexamination Certificate

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Efficient air-flow loop through dual burn-in chambers with...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Extender card for testing error-correction-code (ECC)...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Extender card with intercepting EEPROM for testing and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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In-line D.C. testing of multiple memory modules in a panel...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Profile ID: LFUS-PAI-P-2278231

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