Memory devices configured to detect failure of temperature...

Details Memory devices configured to detect failure of temperature... Memory devices configured to detect failure of temperature...

2008-01-29

2008-01-29

Yoha, Connie C. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Differential sensing

C365S211000, C714S042000

Reexamination Certificate

active

07324398

ABSTRACT:
A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.

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patent: 2003-0035767 (2002-03-01), None
patent: 2002-0091657 (2002-12-01), None

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