Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2006-04-11
2006-04-11
Le, Vu A. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S190000
Reexamination Certificate
active
07027339
ABSTRACT:
A memory device has at least one pair of memory cell blocks, a spare row decoder, a data exchange control signal generator and a data exchange unit. When a defective memory cell in a first memory cell block is repaired with a spare memory cell in a second memory cell block that neighbors (or is adjacent) the first memory cell block, the data topology of the memory cell of the first memory cell may be matched to the memory cell of the second memory cell block.
REFERENCES:
patent: 5523975 (1996-06-01), Reddy
patent: 5835425 (1998-11-01), Berger
patent: 6571352 (2003-05-01), Blodgett
patent: 010093664 (2001-10-01), None
patent: 040008024 (2004-01-01), None
Moon Byung-Sik
Shin Dong-Hak
Song Ho-Sung
F. Chau & Associates LLC
Le Vu A.
Samsung Electronics Co,. Ltd.
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